Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1992-07-13
1993-10-19
Nguyen, Vinh
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 731, 371 151, 371 226, G01R 3102
Patent
active
052549437
ABSTRACT:
For a test operation on a main circuit without supplying a test signal from a test unit, an integrated circuit device includes, a supplementary or test circuit in addition to the main circuit. A test signal is produced in the test circuit and is supplied to the main circuit. Responsive to the test signal, the main circuit produces a data signal. The test circuit processes the data signal into a result signal representative of a result of the test operation. The result signal is supplied to a peripheral or test unit which is well known in the art. It is preferable that the test circuit carries out the test operation with reference to a combination of a particular signal having a predetermined cycle and a particular phase and a specific signal having the predetermined cycle and a specific phase which is different from the particular phase.
REFERENCES:
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 4949033 (1990-08-01), Kono et al.
patent: 4956818 (1990-09-01), Hatayama et al.
patent: 4961053 (1990-10-01), Krug
patent: 5097207 (1992-03-01), Perner
NEC Corporation
Nguyen Vinh
LandOfFree
Integrated circuit device with a test circuit for a main circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit device with a test circuit for a main circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit device with a test circuit for a main circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1354719