Probe forming electron optical column having means for examining

Details Probe forming electron optical column having means for examining Probe forming electron optical column having means for examining

1975-09-15

1977-03-01

Cardillo, Jr., Raymond F.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

1791001B, 346161, 346151, 358129, H04N 576, G11B 900

Patent

active

040103188

ABSTRACT:
An electron optical column apparatus, including a source of electrons, is operable in either a setup or a probe mode. In the setup mode, the electron source is magnified in an image plane for examination of the source by a Faraday cup prior to operation of the column in the probe mode. In the probe mode, the electron source is demagnified on an object surface, for example, for recording video signals on a record medium.

REFERENCES:
patent: 3120991 (1964-02-01), Newberry et al.
patent: 3534166 (1970-10-01), Korpe
patent: 3638231 (1972-01-01), Le Poole et al.

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