Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1998-08-12
2000-07-25
Kim, Robert H.
Optics: measuring and testing
Material strain analysis
By light interference detector
356347, 148510, 148900, 148903, G01B 902
Patent
active
060942606
ABSTRACT:
A method for quality assurance of a laser shock peening process uses interferometry to form a fringe image from first and second interferograms of unstressed and stressed laser shock peened patches respectively of a workpiece. The fringe image may then be compared to a predetermined correlation of fringe images for indicating quality assurance. Stressing the laser shock peened patch may include loading the production and test workpieces during the production of the first and second images by interferometry while the production and test workpieces are fixtured. The loading may be done by heating, twisting, or bending of at least a portion of the production and test workpieces. The comparing of the production images of fringes may include comparing fringe characteristics of the laser shock peened patches on the production workpieces laser against fringe characteristics of the predetermined correlation.
REFERENCES:
patent: 3631713 (1972-01-01), Marom
patent: 3911733 (1975-10-01), Bhuta et al.
patent: 4139302 (1979-02-01), Hung et al.
patent: 4690552 (1987-09-01), Grant et al.
patent: 4702594 (1987-10-01), Grant
patent: 5113079 (1992-05-01), Matulka
patent: 5146289 (1992-09-01), Newman
patent: 5189490 (1993-02-01), Shetty et al.
patent: 5339152 (1994-08-01), Horn
patent: 5432595 (1995-07-01), Pechersky
patent: 5481356 (1996-01-01), Pouet et al.
patent: 5519486 (1996-05-01), Baird et al
patent: 5523839 (1996-06-01), Robinson et al.
patent: 5591009 (1997-01-01), Mannava et al.
patent: 5625664 (1997-04-01), Berkley
patent: 5671042 (1997-09-01), Sciammarella
patent: 5674328 (1997-10-01), Mannava et al.
patent: 5674329 (1997-10-01), Mannava et al.
patent: 5756965 (1998-05-01), Mannava
patent: 5948293 (1999-10-01), Somers et al.
"The Development of New Type Almen Strip for Measurement of Peening Intensity on Hard Shot Peening", by Y. Watanabe, K. Namiki, Sep., 1992, 6 pages.
"New Results In Measuring The Shot Peen Interface In Ti6 4V", by Eddy Current, Jul., 1991, 11 pages.
"X-Ray Diffraction Characterization of Residual Stresses Produced by Shot Peening", by Paul S. Prevey, pp. 82-93.
"Full Assurance Shot Peening Of Aircraft Gas Turbine Engine Components", by PG Bailey, DR Lomardo, HG Popp, RA Thompson, 1996, pp. 320-327.
"Residual Stress Measurment For Quality Control of Shot Peening", by Lambda Research, 2 pages.
"Laser shocking extends fatigue life", by John A. Vaccari, American Machinist, Jul., 1992, 3 pages.
"Laser Shock Processing Increases the Fatigue Life of Metal Parts", Materials and Processing Report, Sep., 1991, pp. 3-5.
"Shearography", ETH Zurich, Festigkeit, Versuch und Messtechnik, Prof. Dr. M. Meier, Jul. 16, 1998, 5 pages.
"Holographic Interferometry", Jul. 16, 1998, 2 pages.
Rockstroh Todd J.
Scheidt Wilbur D.
General Electric Company
Gressel Gerry S.
Hess Andrew C.
Kim Robert H.
Lee Andrew H.
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