Reconfigurable register bit-slice for self-test

Details Reconfigurable register bit-slice for self-test Reconfigurable register bit-slice for self-test

1988-09-23

1990-01-16

Fears, Terrell W.

Excavating

365201, 36518904, 36518908, 365 78, G11C 1300

Patent

active

048948004

ABSTRACT:
A re-configurable register bit-slice is disclosed for use in built-in logic block observers (i.e. BILBOs). The register bit-slice may be configured to a plurality of operational modes. Front-end logic is disclosed which switches a single current switch (e.g. transistor) between a data input and an output of the front-end logic. Thus, a single current switch of delay is added to normal operation of a standard shift register modified to be reconfigurable.

REFERENCES:
patent: 4503537 (1985-03-01), McAnney
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4594711 (1986-06-01), Thatte
patent: 4597080 (1986-06-01), Thatte et al.
patent: 4622647 (1986-11-01), Sagnard et al.
Konemann et al., Build-In Logic Block Observation Techniques, 1979 IEEE H Test Conference, Cherry Hill, N.J., pp. 37-41.
McCluskey, Edward J., Built-In Self-Test Structures, IEEEDesign and Test of Computers, vol. 2, No. 2, Apr. 1985, pp. 29-36.

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