Apparatus for measuring circuit parameters of a packaged semicon

Details Apparatus for measuring circuit parameters of a packaged semicon Apparatus for measuring circuit parameters of a packaged semicon

1987-09-10

1989-08-01

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73AT, G01R 1512

Patent

active

048536288

ABSTRACT:
A semiconductor device includes as part of the integrated circuit thereof a test structure which allows testing of the semiconductor device through the device pins, to allow adjustment of various parameters of the circuit if desired for obtainment of optimum performance, and with the circuit being operable under normal conditions without degradation in relation to its optimum design situation.

REFERENCES:
patent: 3961251 (1976-06-01), Hurley
patent: 3961252 (1976-06-01), Eichelberger
patent: 3961254 (1976-06-01), Cavaliere
patent: 3969670 (1976-07-01), Wu
patent: 4495628 (1985-01-01), Zasio

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