Measurement system and measurement method

Details Measurement system and measurement method Measurement system and measurement method

1988-12-23

1990-01-16

Tarcza, Thomas H.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356 21, 356152, 358107, 901 47, G01C 322, B25J 1900, H04N 718

Patent

active

048939226

ABSTRACT:
In the measurement system for the measurement of an object (2), the object 2) is provided with two retro-reflectors (3, 4) disposed at a known spacing. A measuring device (1) exhibits a light source (5), a video camera (7, 8) and an arrangement (9) which carries out the measurement with reference to the two image points which are formed by the light reflected by the retroreflectors (3, 4). The light source (5) is preferably a flash light source, the flashes of which are synchronized by an arrangement (6) with the imaging sequence of the video camera (7, 8).

REFERENCES:
patent: 3653769 (1972-04-01), Albright
patent: 3773422 (1973-11-01), Stavis et al.
patent: 3796492 (1974-03-01), Cullen et al.
patent: 3917196 (1975-11-01), Pond et al.
patent: 4003659 (1977-01-01), Conard et al.
patent: 4047816 (1977-09-01), Pell et al.
patent: 4053233 (1977-10-01), Bien et al.
patent: 4136950 (1979-01-01), Labrum et al.
patent: 4297725 (1981-10-01), Shimizu et al.
patent: 4355895 (1982-10-01), Cairns et al.
patent: 4373804 (1983-02-01), Pryor et al.
patent: 4373808 (1983-02-01), Pell et al.
patent: 4391514 (1983-07-01), Webster
patent: 4396945 (1983-08-01), DiMatteo et al.
patent: 4652917 (1987-03-01), Miller
patent: 4684247 (1987-08-01), Hammill, III
patent: 4760269 (1988-07-01), McKenna

Affiliated with

Also associated with

Rating

Measurement system and measurement method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measurement system and measurement method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement system and measurement method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1331673