Single wave linear interferometric force transducer

Details Single wave linear interferometric force transducer Single wave linear interferometric force transducer

1995-02-09

1996-09-10

Turner, Samuel A.

Optics: measuring and testing

Material strain analysis

By light interference detector

356345, 356358, G01B 902

Patent

active

055554709

ABSTRACT:
A Michelson interferometer is used to determine the displacement of a force loaded member, the loaded member having a reflective surface applied thereto to reflect light back to a beam splitter in the interferometer apparatus. Light is also reflected back from a reflective surface attached to a stationary member. The interaction of the reflected light from the movable and stationary member interacts to form an interference fringe pattern which may be used to determine the amount of displacement and, therefor, the force applied to the loaded member. The apparatus is comprised of a material which is substantially resistive to thermal deformation.

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