System for circuit modules having a plurality of independently p

Details System for circuit modules having a plurality of independently p System for circuit modules having a plurality of independently p

1996-04-16

1999-03-09

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

058805915

ABSTRACT:
A test system for multi-chip modules. Test points on the multi-chip modules are brought to the perimeter of the modules for easy access. The test points are grouped in arrays with an associated alignment post. The multi-chip module is probed with several independently positionable probes, each one of which can be independently aligned with one of the arrays of test points. Independent alignment of the test probes relaxes tolerances on the test points needed to ensure proper contact between the test pints and the probes. As a result, the test points can be made very small, thereby reducing the amount of the multi-chip module dedicated for testing. In the preferred embodiment, the probes are made using flex circuits.

REFERENCES:
patent: 3453545 (1969-07-01), Oates
patent: 3963985 (1976-06-01), Geldermans
patent: 3968433 (1976-07-01), Dobarganes
patent: 4804132 (1989-02-01), Difrancesco
patent: 5015946 (1991-05-01), Janko
patent: 5083697 (1992-01-01), Difrancesco
patent: 5177436 (1993-01-01), Lee
patent: 5276345 (1994-01-01), Malloy
patent: 5479105 (1995-12-01), Kim et al.
patent: 5497103 (1996-03-01), Ebert et al.
patent: 5506510 (1996-04-01), Blumenau
Probing at Die Level, Advanced Packaging, Jan./Feb. 1995 pp. 26-28 by A.E. Corwith.
Particle Interconnect, Exatron, 4 Pages (Unavailable Date).
The Economics of Automatic Testing, pp. 76-99 by Brendan Davis (Unavailable Date).
Spring Contact Probes, Everett Charles Technologies, pp. 6-9 (Unavailable Date).
Electrical Testing of Multichip Modules, Multichip Module Technologies And Alternatives, pp. 615-795 by Thomas C. Russell and Yenting Wen, (Unavailable Date).

Affiliated with

Also associated with

Rating

System for circuit modules having a plurality of independently p does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for circuit modules having a plurality of independently p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for circuit modules having a plurality of independently p will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1324867