Method of reducing a measuring time during an automatic measurem

Details Method of reducing a measuring time during an automatic measurem Method of reducing a measuring time during an automatic measurem

1997-03-13

1999-07-20

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 100

Patent

active

059260300

ABSTRACT:
A method of testing ICs in parallel is capable of receiving a state signal from handlers to estimate process start times of the handlers, and of changing a test start request interruption wait time. Automatic carriages automatically supply and accommodate IC issue test start request interruption signals to an external device control circuit of an IC tester. IC testing stations execute tests of ICs at the same time. When the test start request interruption signals are not issued from all the automatic carriages, a computer of the IC tester reads an operating state of the automatic carriages which do not issue the test start request interruption signal so as to judge whether the automatic carriage is in a significant wait condition. The IC testing stations immediately execute the test of ICs if the automatic carriages are not in the significant state. The computer calculates an optimal wait time if the automatic carriage is in the significant state, and the IC testing stations execute the test at the time when the optimal wait time lapses.

REFERENCES:
patent: 3662881 (1972-05-01), Fineran
patent: 5440241 (1995-08-01), King et al.

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