Method of and apparatus for automatic measurement of impedance o

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324 57R, G01R 2700

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active

041964756

ABSTRACT:
This disclosure is concerned with a new technique for automatically measuring impedance (though the process is also applicable to other parameters and characteristics as well) wherein a series of voltages are sequentially presented to a common detector and analog-to-digital converter, the numerical values of which voltages are of themselves meaningless, but from which, with the aid of microprocessor calculating equipment, ratios may be calculated that indicate impedance (or other parameters).

REFERENCES:
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patent: 3562641 (1971-02-01), Fulks
patent: 3593126 (1971-07-01), May
patent: 3652930 (1972-03-01), Sugiyama
patent: 3859594 (1975-01-01), Grindheim
patent: 3984768 (1976-10-01), Staples
patent: 3992665 (1976-11-01), Preikschat
patent: 4034190 (1977-07-01), White
Kaufmann; Analogue Voltages Monitored by Microprocessor; Electronic Engineering, vol. 48, No. 580, pp. 23, 25, 27, Jun. 1976.
Lucas, Paul; Using Ratiometry to Measure Resistance; Instruments and Control Systems; Jun. 1973, pp. 78-79.

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