Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1995-07-14
1996-09-10
Noland, Thomas P.
Measuring and testing
Surface and cutting edge testing
Roughness
73 9, G01B 1130, G01N 1902
Patent
active
055534872
ABSTRACT:
A method of operating an atomic force microscope having a probe tip attached to a free end of a lever which is fixed at its other, wherein the probe tip is scanned in forward and reverse directions in a common scanline across the surface of a sample and either the deflection of the lever or the height of the sample is detected during the forward and reverse scans. The difference between the deflection of the lever or the sample height in the forward and reverse scans is determined as a relative measure of friction. A signal relating to the normal force applied to the sample, can be determined and based thereon, a coefficient of friction of the sample is determined. The signal relating to normal force is derived either from a force curve, or by scanning the probe at different force setpoints. To enhance accuracy of topographical data, the scanning angle is varied in order to minimize differences between the probe deflection (or sample height) during scanning in the forward and reverse directions. Once it is determined which angle results in minimum difference in data obtained during scanning in the forward and reverse directions in a common scanline, topographical data is obtained by scanning the sample at that angle. Frictional data is obtained by scanning at that angle which maximizes the difference between data obtained in forward and reverse scanning directions in a common scanline.
REFERENCES:
patent: Re33387 (1990-10-01), Binnig
patent: 4081989 (1978-04-01), Majcherczyk
patent: 4935634 (1990-06-01), Hansma et al.
patent: 5025658 (1991-06-01), Elings et al.
patent: 5051646 (1991-09-01), Elings et al.
patent: 5077473 (1991-12-01), Elings et al.
patent: 5193383 (1993-03-01), Burnham et al.
patent: 5198667 (1993-03-01), Glembocki et al.
patent: 5347854 (1994-09-01), Martin et al.
patent: 5363697 (1994-11-01), Nakagawa
patent: 5412980 (1995-05-01), Elings et al.
patent: 5415027 (1995-05-01), Elings et al.
Digital Instruments, Inc.
Noland Thomas P.
LandOfFree
Methods of operating atomic force microscopes to measure frictio does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of operating atomic force microscopes to measure frictio, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of operating atomic force microscopes to measure frictio will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1312039