Electricity: measuring and testing – Magnetic – Displacement
Patent
1984-02-23
1986-01-28
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Displacement
324225, 324241, 340618, G01B 714, G01F 2300, G01R 3312
Patent
active
045674353
ABSTRACT:
The distance between the tip of a probe and a high-temperature object of measurement is continuously and accurately measured by arranging the probe comprising a primary coil and a pair of secondary coils substantially vertically to the object of measurement; inducing an AC voltage (e.sub.1) and an AC voltage (e.sub.2) respectively in the pair of secondary coils by means of an AC magnetic field of the primary coil excited by an output voltage (e.sub.out) of a positive feedback amplifier; generating an eddy current in the object of measurement by means of the AC magnetic field of the primary coil to generate another AC magnetic field in the direction opposite to that of the AC magnetic field of the primary coil; impressing an equal DC voltage onto each of the pair of secondary coils to detect respectively a DC voltage (E.sub.1) and a DC voltage (E.sub.2) of the pair of secondary coils; calculating an error voltage (e.sub.4) corresponding to the difference in temperature between the pair of secondary coils, on the basis of the output voltage (e.sub.out) and a value of difference (E.sub.3) between the DC voltages (E.sub.1) and (E.sub.2); and feeding a value of difference (e.sub.3") between the error voltage (e.sub.4) and a value of difference (e.sub.3) between the AC voltages (e.sub.1) and (e.sub.2), back to the positive feedback amplifier, thereby determining the output voltage (e.sub.out) of the positive feedback amplifier, from which the influence of the difference in temperature between the pair of secondary coils has been eliminated.
REFERENCES:
patent: 4283680 (1981-08-01), Kerr
Ando Seigo
Kawase Yoshihiro
Yamada Takeo
Yamamoto Tomohisa
Nippon Kokan Kabushiki Kaisha
Strecker Gerard R.
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