Test handler for semiconductor devices

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Details

36446822, 36446823, 36446828, 324754, 324755, 414222, 414287, G06F 710, G01R 3128

Patent

active

058054723

ABSTRACT:
In a test handler for semiconductor devices according to the invention, test trays are provided with respective identification codes specific to them and the identification codes of the test trays are read by a reading device arranged respectively at given control sites in the test handler and stored in a control table and controlled by a control device along with data on the control sites for reading the identification codes of test trays and the product ICs loaded on the test trays carrying the detected identification codes. Additionally, the contents of the control table are displayed on a monitor screen and the data on the individual test trays obtained at the individual control sites and those on the product ICs are centrally controlled.

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patent: 5654204 (1997-08-01), Anderson

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