Boots – shoes – and leggings
Patent
1997-02-21
1998-09-08
Ruggiero, Joseph
Boots, shoes, and leggings
250306, 250307, G01N 2300, G06F 1900
Patent
active
058054480
ABSTRACT:
A scanning probe microscope controller includes a digital signal processor (DSP) and an analog feedback control loop. The DSP serves to process the output of the scanning probe in the digital realm after conversion of the signal to digital form. After processing, the signal is restored to analog form. The height correction signal to be applied to a transducer controlling the distance between the scanning probe and a sample surface is then generated by an analog feedback control circuit, at least one parameter of which is under computer control. At the end of each scan-line, a variance may be calculated for the data and the inverse of this quantity is used to adjust the gain with which digitization of the data is carried out. Linearization of the data to correct for non-linearities in the scanning transducers may be carried out by the DSP after the data is acquired. This permits the scanning ramps applied to the transducers to be linear but the final displayed data do not show the effects of non-linearities. Adjustment of the feedback control loop gain may be carried out by monitoring the signal level from the scanning probe as each line is scanned. A computer determines if slow variations in this signal level have occurred across a line-scan. If so, the gain is increased. This process is continued until signals characteristic of excess gain (oscillation) are detected. At that point, the gain is reduced to a level slightly below the onset of the oscillation.
REFERENCES:
patent: Re34331 (1993-08-01), Elings et al.
patent: Re34708 (1994-08-01), Hansma et al.
patent: 4823004 (1989-04-01), Kaiser et al.
patent: 4837435 (1989-06-01), Sukahara et al.
patent: 4889988 (1989-12-01), Elings et al.
patent: 4954704 (1990-09-01), Elings et al.
patent: 4969978 (1990-11-01), Tomita et al.
patent: 4992728 (1991-02-01), McCord et al.
patent: 5009111 (1991-04-01), West et al.
patent: 5017010 (1991-05-01), Mamin et al.
patent: 5018865 (1991-05-01), Ferrel et al.
patent: 5051646 (1991-09-01), Elings et al.
patent: 5066858 (1991-11-01), Elings et al.
patent: 5077473 (1991-12-01), Elings et al.
patent: 5081390 (1992-01-01), Elings et al.
patent: 5107113 (1992-04-01), Robinson
patent: 5120959 (1992-06-01), Tomita
patent: 5202004 (1993-04-01), Kwak et al.
patent: 5204531 (1993-04-01), Elings et al.
patent: 5210410 (1993-05-01), Barrett
patent: 5224376 (1993-07-01), Elings et al.
patent: 5229606 (1993-07-01), Elings et al.
patent: 5231286 (1993-07-01), Kajimura et al.
patent: 5237859 (1993-08-01), Elings et al.
patent: 5253516 (1993-10-01), Elings et al.
patent: 5262643 (1993-11-01), Hammond et al.
patent: 5266801 (1993-11-01), Elings et al.
patent: 5266896 (1993-11-01), Rugar et al.
patent: 5266897 (1993-11-01), Watanuki et al.
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5280341 (1994-01-01), Nonnenmacher
patent: 5283442 (1994-02-01), Martin et al.
patent: 5286004 (1994-02-01), Okada et al.
patent: 5293042 (1994-03-01), Miyamoto et al.
patent: 5304924 (1994-04-01), Yamano et al.
patent: 5308974 (1994-05-01), Elings et al.
patent: 5321977 (1994-06-01), Clabes et al.
patent: 5323003 (1994-06-01), Shido et al.
patent: 5329122 (1994-07-01), Sakai et al.
patent: 5329515 (1994-07-01), Kawgishi et al.
patent: 5329808 (1994-07-01), Elings et al.
patent: 5331589 (1994-07-01), Gambino et al.
patent: 5336369 (1994-08-01), Kado et al.
patent: 5336887 (1994-08-01), Yagi et al.
patent: 5345815 (1994-09-01), Albrecht et al.
patent: 5345816 (1994-09-01), Clabes et al.
patent: 5347854 (1994-09-01), Martin et al.
patent: 5357105 (1994-10-01), Harp et al.
patent: 5371727 (1994-12-01), Shido et al.
patent: 5381101 (1995-01-01), Bloom et al.
patent: 5388452 (1995-02-01), Harp et al.
patent: 5438206 (1995-08-01), Yokoyama et al.
patent: 5481521 (1996-01-01), Washizawa et al.
patent: 5497000 (1996-03-01), Tao et al.
"Novel Stationary-Sample Atomic Force Microscope with Beam-Tracking Lens"; P.S. Jung and D.R. Yaniv; Feb. 4, 1993; Electronic Letters, vol. 29, No. 3, pp. 264-265.
"Control electronics for atomic force microscopy"; Marti, et al.; Review of Scientific Instruments, vol. 59, No. 6, Jun. 1988; pp. 836-839.
"Digital Control Systems"; Control System Compensation and Implementation with the TMS32010; Texas Instruments, Reprinted Jun. 1989, Exhibit C.
"Chemical Applications of Scanning Tunneling Microscopy"; West, et al.; IBM Journal of Research Development, vol. 30, No. 5, Sep. 1986, pp. 484-490.
"Candidacy Report; Kramer John Adam", May 21, 1985; pp. 1-48.
"Atomic Force Microscope-Force Mapping and Profiling on a sub 100-A Scale"; Martin, et al.; Journal of Applied Physics, 61(10) May 15, 1987, American Institute of Physics, pp. 4723-4729.
"Implementation of Digital Controllers--A Survey"; Hanselmann, Automation, vol. 23, No. 1, pp. 7-32 1987.
"Atomic Force Microscope"; Hansma, et al.Journal of Applied Physics, 76 (2) Jul. 15, 1994, American Institute of Physics, pp. 796-799.
Putman, et al., "Viscoelasticity of living cells allows high-resolution imaging by taping mode atomic force micrscopy", Department of Applied Physics, University of Twente, Jan. 4, 1994.
Jing Tianwei
Lindsay Stuart M.
Molecular Imaging Corporation
Ruggiero Joseph
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