Coded data generation or conversion – Converter calibration or testing
Patent
1996-02-12
1998-09-08
Hoff, Marc S.
Coded data generation or conversion
Converter calibration or testing
340662, H03M 110
Patent
active
058050914
ABSTRACT:
An invalid reference detection circuit formed on a semiconductor chip having: reference input terminals adapted for coupling to a reference source external to the chip; a local reference source; and comparison circuit. The comparison circuit is responsive to the local reference source and a condition at the reference input terminals to detect an invalid condition at the reference input terminals and to produce an output signal indicative of the detected invalid condition. The invalid condition at the reference input terminals may be an open circuit condition at at least one of the reference input terminals, a condition when the voltage across the reference input terminals is below a predetermined minimum voltage level, a condition when the voltage across the reference input terminals is above a predetermined maximum voltage level, and/or a short circuit condition. An analog/digital conversion system is formed on a semiconductor chip together with the invalid reference detection circuit. The reference input terminals are adapted for coupling to the reference source external to the chip to the conversion circuitry to provide a reference for such conversion circuitry.
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Analog Devices 3V/5 V, CMOS, 500 .mu.A, Signal Conditioning ADC, AD7714, Oct. 1994.
McCartney Damien
Sherry Adrian
Analog Devices Inc.
Hoff Marc S.
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