Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1990-10-15
1993-03-30
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, 356 1, 356 4, 356141, G01B 1114, G01B 1124, G01C 308
Patent
active
051988771
ABSTRACT:
This method and apparatus optically samples numerous points on the surface of an object to remotely sense its shape utilizing two stages. The first stage employs a moveable non-contact scanner, which in normal operation sweeps a narrow beam of light across the object, illuminating a single point of the object at any given instant in time. The location of that point relative to the scanner is sensed by multiple linear photodetector arrays behind lenses in the scanner. These sense the location by measuring the relative angular parallax of the point. The second stage employs multiple fixed but widely separated photoelectronic sensors, similar to those in the scanner, to detect the locations of several light sources affixed to the scanner, thereby defining the absolute spatial positions and orientations of the scanner. Individual light sources are distinguished by time-multiplexing their on-off states. A coordinate computer calculates the absolute spatial positions where the scanner light beam is incident on the object at a given instant and continuously on a real time basis to generate a computer model of the object.
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Pham Hoa Q.
PixSys, Inc.
Rosenberger Richard A.
Young James R.
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