Input transient protection for integrated circuit element

Details Input transient protection for integrated circuit element Input transient protection for integrated circuit element

1975-04-03

1976-06-29

Larkins, William D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

357 23, 357 41, 357 42, 307202R, 307304, H01L 2702, H01L 2978, H02H 720, H03K 3353

Patent

active

039672956

ABSTRACT:
In an integrated circuit which includes an element which is subject to destructive breakdown upon the application thereto of a high voltage, means including a semiconductor current limiting resistor bounded by a PN junction is formed in the device and coupled between a conductor and the circuit element. One end of the current limiting resistor is coupled to the conductor and has a configuration such that a distributed resistance is included within the resistor between the conductor and the PN junction boundary of the resistor, to protect the PN junction bounding the resistor.

REFERENCES:
patent: 3590340 (1971-06-01), Kubo et al.
patent: 3615932 (1971-10-01), Makimoto et al.
patent: 3629782 (1971-12-01), Sahni
patent: 3667009 (1972-05-01), Rugg
patent: 3673428 (1972-06-01), Athanas
patent: 3712995 (1973-01-01), Steudel
patent: 3748547 (1973-07-01), Sugimoto
patent: 3754171 (1973-08-01), Anzai et al.
patent: 3934159 (1976-01-01), Nomiya et al.
RCA Cos/Mos Integrated Circuits Manual, (3/1971), p. 55, RCA Solid State Division, Somerville, N.J.
R. S. Samson, "Obtaining High Resistance in Integrated Circuits", IBM Technical Disclosure Bulletin, vol. 13, (1/1971), p. 2151.

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