Semiconductor device with multi-layered metal interconnections

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357 54, 357 67, 357 68, 357 69, H01L 2952, H01L 2954

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active

039421872

ABSTRACT:
Improved metal interconnections for a semiconductor device is described. The interconnections comprise a first metal layer, eg. aluminum, connected to the semiconductor, a second metal layer, eg. gold, for external connection, and a third metal layer interconnecting the first and second metal layers such that the junction areas of interconnection are laterally spaced from one another.

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