Second harmonic analyzer

Details Second harmonic analyzer Second harmonic analyzer

1975-03-24

1976-03-02

Stolwein, Walter

Optics: measuring and testing

Crystal or gem examination

356 51, 250226, 250578, G01N 2100

Patent

active

039414787

ABSTRACT:
A method and device for determining acentricities in a powder material by illuminating the powder with a collimated coherent light beam of given wave-length which generates a second harmonic in the material. The second harmonic with the fundamental removed by filters is divided by a beam splitter and sent to two photomultipliers -- one of which has a narrow band filter to select only light of one wave-length. If all the light is generated at the second harmonic equal signals are produced by the photomultipliers. If non-second harmonic radiation is produced, a larger signal will be produced in the unfiltered reference channel.

REFERENCES:
patent: 2802947 (1957-08-01), Hamacher
patent: 3407309 (1968-10-01), Miller
kurtz et al., Journal of Applied Physics, Vol. 39, No. 8, pp. 3798--3813, July 1968.

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