Two-dimensional beam scanner

Details Two-dimensional beam scanner Two-dimensional beam scanner

1988-05-06

1989-06-13

Evans, Arthur G.

350 69, G02B 2717

Patent

active

048386324

ABSTRACT:
A beam scanning system having a beam reflecting element, such as a mirror, disposed in the path of an incident beam defining an optical axis, which is pivotable about two perpendicular axes so as to provide for scanning a reflected beam in two dimensions. A pivot axis is perpendicular to the optical axis and may be provided by a spindle supporting a galvanometer mirror. The second axis coincides with the optical axis and may be provided by a meter driven shaft attached to the mirror support which is rotatable about the optical axis. The reflecting element reflects the beam toward an image plane that is parallel to the incident beam so as to scan a sequence of parallel lines without pincushion errors. An optical f-.theta. correcting lens may be provided in the reflected beam path to correct for tangential spacing errors in the image plane.

REFERENCES:
patent: 4256364 (1981-03-01), Minoura et al.
patent: 4375063 (1983-02-01), Kitamura
patent: 4505578 (1985-03-01), Balasubramanian
Mecklenburg, A. C., "Two-Mirror, Two-Axis, Rapid Frame Rate Galvanometer Scanning Using a Novel Resonant Scanner/Dynamic Focusing Mechanism", SPIE, 1987.

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