Method of manufacturing a semiconductor IC device having multila

Fishing – trapping – and vermin destroying

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437189, 437192, 437196, 437228, H01L 2144

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active

053507126

ABSTRACT:
A first insulating layer is formed on the major surface of a semiconductor substrate, and a first-level metal wiring layer is formed on the first insulating layer. A refractory metal layer is selectively grown on that side portion (or those side and upper portions) of the first-level metal wiring layer which is (or are) located in the vicinity of a contact formation region of the first-level metal wiring layer. A second insulating layer is formed on the resultant structure, and then a through hole is formed by the RIE method in the first-level metal wiring layer in the contact formation region. The first-level metal wiring layer, or the first-level metal wiring layer and part of the refractory metal layer are exposed through the through hole. A second-level metal wiring layer is formed such that it fills the through hole, extends on part of the second insulating layer, and is electrically connected to the first-level metal wiring layer.

REFERENCES:
patent: 4968644 (1990-11-01), Gallagher et al.
patent: 5100838 (1992-03-01), Dennison
patent: 5187121 (1993-02-01), Cote et al.
patent: 5286674 (1994-02-01), Roth et al.

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