Electrode system to facilitate dielectric measurement of materia

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

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Details

324661, 324663, 324686, 324688, 324690, G01R 2726

Patent

active

051402734

ABSTRACT:
An electrode system (ES) according to the present invention provides greater flexibility in choosing the shape of the sample to be investigated, and reliable measurements when oriented in either a horizontal or vertical position. Moreover, means are provided for easily maintaining and calibrating the parallelism of the electrodes.

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patent: 4855667 (1989-08-01), Hendrick et al.
patent: 4881025 (1989-11-01), Gregory
patent: 4899102 (1990-02-01), Hendrick et al.
patent: 5065106 (1991-11-01), Hendrick et al.

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