Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-04-04
1992-08-18
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324661, 324663, 324686, 324688, 324690, G01R 2726
Patent
active
051402734
ABSTRACT:
An electrode system (ES) according to the present invention provides greater flexibility in choosing the shape of the sample to be investigated, and reliable measurements when oriented in either a horizontal or vertical position. Moreover, means are provided for easily maintaining and calibrating the parallelism of the electrodes.
REFERENCES:
patent: 4294321 (1981-10-01), Wittlinger et al.
patent: 4568873 (1986-02-01), Oyanagi et al.
patent: 4658254 (1987-04-01), Walton
patent: 4855667 (1989-08-01), Hendrick et al.
patent: 4881025 (1989-11-01), Gregory
patent: 4899102 (1990-02-01), Hendrick et al.
patent: 5065106 (1991-11-01), Hendrick et al.
Brown Glenn W.
Hewlett--Packard Company
Wieder Kenneth A.
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