Excavating
Patent
1995-03-29
1997-11-11
Baker, Stephen M.
Excavating
G01R 313185
Patent
active
056871791
ABSTRACT:
A serial scan path communication architecture includes a plurality of circuits (30), some of which may include a memory (36). A memory access controller (38) is included on circuits with a memory (36) such that serial data may be written to and written from the memories without having to repetitively cycle through multiple shift operations.
REFERENCES:
patent: 4357703 (1982-11-01), Van Brunt
patent: 4710933 (1987-12-01), Powell et al.
patent: 4791358 (1988-12-01), Sauerwald et al.
patent: 4866508 (1989-09-01), Eichelberger et al.
patent: 4903266 (1990-02-01), Hack
patent: 4931722 (1990-06-01), Stoica
Dervisoglu, B., "Using Scan Technology for Debug and Diagnostics in a Workstation Environment", 1988 International Test Conference, pp. 976-986.
Whetsel, L., "A Standard Test Bus and Boundary Scan Architecture", TI Technical Journal, Jul.-Aug. 1988, pp. 48-59.
van Riessen, R. et al., "Design and Implementation of a Hierarchical Testable Architecture . . . ", Proc. 1st European Test Conf., Apr. 1989, pp. 112-118.
No author, "Test Bus Architecture", IBM Technical Disclosure Bulletin, vol. 32, No. 3A, Aug. 1989, pp. 21-27.
Wang, L-T. et al., "A Self-Test and Self-Diagnosis Architecture for Boards Using Boundary Scans", 1st European Test Conference, Apr. 1989, pp. 119-126.
Avra, L., "A VHSIC ETM-Bus--Compatible Test and Maintenance Interface", 1987 International Test Conference, pp. 964-971.
Breuer, M. et al., "A Test and Maintenance Controller for a Module Containing Testable Chips", Proc. 1988 International Test Conf., pp. 502-513.
Lien, J. et al., "A Universal Test and Maintenance Controller for Modules and Boards", IEEE Trans. on Industrial Electronics, vol. 36, No. 2, May 1989, pp. 231-240.
Blair, J. et al., "A 16-Mbit/s Adapter Chip for the IBM Token-Ring Local Area Network", IEEE Jour. of Solid-State Circuits, vol. 24, No. 6, Dec. 1989, pp. 1647-1654.
Ashmore, Jr. Benjamin H.
Whetsel, Jr. Lee D.
Baker Stephen M.
Courtney Mark E.
Donaldson Richard L.
Franz Warren L.
Texas Instruments Incorporated
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