Electrical lap guide data acquisition unit and measurement schem

Details Electrical lap guide data acquisition unit and measurement schem Electrical lap guide data acquisition unit and measurement schem

1997-05-07

1999-11-23

Wachsman, Hal

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

702 64, 702 57, 702116, 702118, 451 1, 451 5, 451 8, 296031, 29593, 2960309, G06F 1900

Patent

active

059916982

ABSTRACT:
A lapping system data acquisition unit is disclosed for use in measuring resistances of multiple resistors embedded in a structure to be machined. Each of multiple independent current sources directs a current through one of the multiple resistors embedded in the structure during machining of a surface of the structure. Each of multiple voltage sensing devices couples to a separate one of the multiple resistors and provides a separate analog voltage output signal indicative of the resistance of the resistor. Each of multiple filters is coupled to a separate one of the multiple voltage sensing devices Analog-to-digital conversion circuitry coupled to the multiple filters generates a digitized signal for each of the filtered output signals.

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