Method for identifying excessive power consumption sites within

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364488, 395750, 326 56, 326 21, 327537, 327546, 331 1A, 371 251, G06G 748, G06F 1500

Patent

active

055153020

ABSTRACT:
A method for minimizing power consumption in a circuit is accomplished by identifying, based on the test parameters and topology information for the circuit, potential excessive power consuming sites. Next, the potential excessive power consuming sites, or potential leakage current sites, are monitored, based on the test parameters, for indeterminate logic states which result in leakage current and excessive power consumption. A report is generated detailing the locations of any leakage current sites, whereby the circuit may be modified to eliminate the leakage current sites prior to fabrication.

REFERENCES:
patent: 4429281 (1984-01-01), Ito et al.
patent: 4542485 (1985-09-01), Iwahashi et al.
patent: 4612618 (1986-09-01), Pryor et al.
patent: 4631686 (1986-12-01), Ikawa et al.
patent: 4639557 (1987-01-01), Butler et al.
patent: 4698760 (1987-10-01), Lembach et al.
patent: 4743864 (1988-05-01), Nakagawa et al.
patent: 4827428 (1989-05-01), Dunlop et al.
patent: 4922432 (1990-05-01), Kobayashi et al.
patent: 4961053 (1990-10-01), Krug
patent: 5005136 (1991-04-01), Van Berkel et al.
patent: 5119314 (1992-06-01), Hotta et al.
patent: 5264743 (1993-11-01), Nakagome et al.
patent: 5349542 (1994-09-01), Brasen et al.
patent: 5383137 (1995-01-01), Burch
patent: 5392221 (1995-02-01), Donath et al.
patent: 5428560 (1995-06-01), Leon et al.
patent: 5432328 (1995-07-01), Yamaguchi
Designing in Power-down Test Circuits , Paul S. Levy, VLSI Technoloy Inc. IEEE Sep. 1991.
Ruehli et al., "Analytical Power/Timing Optimization Technique for Digital System", pp. 142-146.
Matson, "Optimization of Digital MOS VLSI Circuits", Chapel Hill Conference, 1985, pp. 109-115.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for identifying excessive power consumption sites within does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for identifying excessive power consumption sites within , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for identifying excessive power consumption sites within will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1232501

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.