Method and apparatus for correcting exposure patterns, and expos

Photocopying – Projection printing and copying cameras – Step and repeat

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430 5, G03B 2742, G03F 900

Patent

active

059910062

ABSTRACT:
A method of transforming the exposure pattern is provided so as to obtain a transferred image as being closest possible to the object design pattern in a lithography process. The method includes the steps of dividing a visible outline of desired design pattern P into a plurality of edges according to a specified rule, then assigning a plurality of evaluation points H to each of the edges; computing a transferred image of an exposed pattern by simulation; computing a distance between each evaluation point H on each edge E and a position corresponding to each evaluation point H of the transferred image of the exposed pattern; and determining a corrected exposure pattern by inputting the distance to a specified evaluation function to correct the position of each edge E according to the output value of the evaluation function.

REFERENCES:
patent: 5422491 (1995-06-01), Sakamoto
patent: 5561317 (1996-10-01), Momma et al.
patent: 5667923 (1997-09-01), Kanata
patent: 5698346 (1997-12-01), Sugawara
patent: 5700601 (1997-12-01), Hasegawa et al.
patent: 5792581 (1998-08-01), Ohnuma
patent: 5825647 (1998-10-01), Tsudaka

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