Wrapper cell architecture for path delay testing of embedded cor

Details Wrapper cell architecture for path delay testing of embedded cor Wrapper cell architecture for path delay testing of embedded cor

1997-02-03

1999-03-30

Beausoliel, Jr., Robert W.

Excavating

371 2232, G06F 1100

Patent

active

058897887

ABSTRACT:
An integrated circuit contains customer specified logic (12), an embedded core (14), and a plurality of speed path test cells (16 and 18). Once the core (14) is embedded within an integrated circuit (10), not all of the input and output terminals of the embedded core are available at external terminals of the integrated circuit (10). Therefore, the wrapper speed path test cells (16 and 18) are provided. The cell (16) contains two flip-flops (20 and 22) which can be used to launch logic transitions into the embedded core (14) to perform two clock speed path testing. The cell (18) contains flip-flops (26 and 28) which can perform a speed path launch operations to a customer specified logic (12). The cell (16) can perform speed path capture operations for the customer specified logic (12) whereas the cell (18) can perform speed path capture operations for the embedded core (14).

REFERENCES:
patent: 4564943 (1986-01-01), Collins et al.
patent: 5054024 (1991-10-01), Whetsel
patent: 5220281 (1993-06-01), Matsuki
patent: 5229657 (1993-07-01), Rackley
patent: 5260947 (1993-11-01), Posse
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 5260950 (1993-11-01), Simpson et al.
patent: 5285453 (1994-02-01), Gruodis
patent: 5381420 (1995-01-01), Henry
patent: 5592493 (1997-01-01), Crouch et al.
patent: 5600787 (1997-02-01), Underwood et al.
patent: 5638380 (1997-06-01), De
patent: 5642362 (1997-06-01), Savir
patent: 5717700 (1998-02-01), Crouch et al.
patent: 5717702 (1998-02-01), Stokes et al.
patent: 5748645 (1998-05-01), Hunter et al.
patent: 5748647 (1998-05-01), Bhattacharya et al.

Affiliated with

Also associated with

Rating

Wrapper cell architecture for path delay testing of embedded cor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wrapper cell architecture for path delay testing of embedded cor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wrapper cell architecture for path delay testing of embedded cor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1221287