Probes for fixed point probe cards

Details Probes for fixed point probe cards Probes for fixed point probe cards

1975-07-21

1983-05-03

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158P, G01R 3102, G01R 106

Patent

active

043822282

ABSTRACT:
Probes for a probe card adapted to test integrated circuit patterns having contacts deployed thereon, the card including an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. The probes are adapted to be anchored on selected pads of the card, each probe being constituted by a rigid, blade-like needle-holder having a deflectable needle extending therefrom to engage a respective contact in the pattern being tested.

REFERENCES:
patent: 3560907 (1971-02-01), Heller
patent: 3810017 (1974-05-01), Wiesler et al.

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