Method of detecting particle-like point in an image

Details Method of detecting particle-like point in an image Method of detecting particle-like point in an image

1997-12-09

1999-10-05

Mancuso, Joseph

Image analysis

Applications

Manufacturing or product inspection

348126, G06K 900

Patent

active

059636610

ABSTRACT:
A particle-like point in an image is detected to detect a defect by directly processing an image of an object to be inspected. The image is first binarized, and the binarized image is scanned along an X-axis or a Y-axis, and a particle-like point in the image is approximated by a rectangular area. Information representative of the coordinates of the center of the rectangular area and the size of the rectangular area is outputted as information of the detected particle-like point.

REFERENCES:
patent: 5229304 (1993-07-01), Chang et al.
patent: 5311598 (1994-05-01), Bose et al.

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