Microplanarization of rough electrodes by thin amorphous layers

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

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257311, 148 33, 437 60, H01L 2702, H01L 2700

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active

055876145

ABSTRACT:
A method of improving the dielectric properties of a thin dielectric disposed on a polycrystalline material, a method of forming a capacitor therewith and the capacitor. An electrode (17) having a polycrystalline material surface having voids (23) extending to the surface, preferably silicon, is provided. A layer of an amorphous form of the material (19) having a thickness of from about 20 .ANG. to about 500 .ANG. is formed over the surface with the amorphous layer disposed within the voids. A thin layer of a dielectric (21) is formed over the amorphous layer and, in the fabrication of a capacitor, a layer of electrical conductor (25) is provided which is spaced from the material over the dielectric. A microcontaminant can be disposed between the polycrystalline material surface and the amorphous layer.

REFERENCES:
patent: 4737474 (1988-12-01), Price et al.
patent: 4931897 (1990-06-01), Tsukamoto et al.
patent: 5376576 (1994-12-01), Moon et al.
patent: 5411912 (1995-05-01), Sakamoto

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