Method of forming a semiconductor device in a substrate depressi

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 40, 437 29, 437913, H01L 2144, H01L 2148

Patent

active

055873405

ABSTRACT:
A field effect transistor is formed on a side surface of a rectangular parallelepiped depression formed in the upper surface of a single crystalline substrate. The orientation of the side surface is substantially selected in the (100) plane or an equivalent plane of the crystalline structure of the substrate. A sate electrode is formed on the side surface with a gate insulating film therebetween. Source and Drain regions are formed in the bottom of the depression and the surface of the substrate adjacent to the depression by ion implantation with the gate electrode as a mask.

REFERENCES:
patent: 4734384 (1988-03-01), Tsuchiya
patent: 4786953 (1988-03-01), Morie et al.
patent: 4845539 (1989-07-01), Inoue
patent: 4891327 (1990-01-01), Okumura
patent: 4920065 (1990-04-01), Chin et al.
patent: 4975383 (1990-12-01), Baglee
patent: 5017504 (1991-05-01), Nishimura
patent: 5027173 (1991-06-01), Satoh
patent: 5032882 (1991-07-01), Okumura et al.
patent: 5047359 (1991-09-01), Nagatomo
patent: 5053842 (1991-10-01), Kojima
patent: 5056010 (1991-10-01), Kimura

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a semiconductor device in a substrate depressi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a semiconductor device in a substrate depressi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a semiconductor device in a substrate depressi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1178454

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.