Position measuring apparatus with multiple scanning locations

Details Position measuring apparatus with multiple scanning locations Position measuring apparatus with multiple scanning locations

1988-07-22

1991-02-05

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

25023114, 341 11, 341 13, G01D 538, G01P 3486

Patent

active

049907670

ABSTRACT:
A measuring device is provided in which a graduated plate is scanned in at least two scanning locations. The scanning signals from the different scanning locations are transmitted to a testing circuit which determines whether the phase displacement between the scanning signals exceeds a limit value. If the limit value is exceeded, one of the scanning locations is weighted higher than the other. The weighting is implemented by increasing the components of the signals from one scanning location while decreasing the components from the signals from the other scanning location.

REFERENCES:
patent: 4567462 (1986-01-01), Leiby
patent: 4580046 (1986-04-01), Sasaki et al.
patent: 4580047 (1986-04-01), Sasaki
patent: 4779211 (1988-10-01), March

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