Apparatus for, and method of, analyzing signals

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 77B, 328133, 364484, G01R 2500, G01R 2300

Patent

active

049012444

ABSTRACT:
The spectral components of both an original signal and a shifted version of the signal, for example a signal which is subjected to a time delay relative to the original signal, are obtained by means of Fourier Transform. This gives sets of first and second spectral components corresponding respectively to the original signal and the shifted signal. The phases of at least one pair of corresponding first and second spectral components are obtained, and subtracted to give a phase difference. The first aspect of the method measures the frequency of corresponding constituent of the original signal from the said phase difference based on a prior knowledge of the amount of shift. Further, having measured the frequency, one can measure the initial phase and amplitude of corresponding constituent of the signal. A second aspect of the method and an apparatus measure the amount of shift between two received signals from the said phase difference by means of a prior knowledge of the frequency of corresponding constituent of the signal. A third aspect of the method and an apparatus detect the existence of dominant constituent of the signal. This approach compares the difference in phases between adjacent spectral components of a signal with a constant value, (1-1/N).pi.. The measured signals can vary temporally or spatially.

REFERENCES:
patent: 3903401 (1975-09-01), Jayant
patent: 3920978 (1975-11-01), Schmitt et al.
patent: 3984669 (1976-10-01), Lehmann et al.
patent: 4068309 (1978-01-01), Drukarch
patent: 4135243 (1979-01-01), Peregrino et al.
patent: 4144572 (1979-03-01), Starner et al.
patent: 4178631 (1979-12-01), Nelson, Jr.
patent: 4279017 (1981-07-01), Bos et al.
patent: 4301404 (1981-11-01), Ley
patent: 4310891 (1982-01-01), Niki
patent: 4319329 (1982-03-01), Girgis et al.
patent: 4333150 (1982-06-01), Matty et al.
patent: 4334273 (1982-06-01), Ikeda
patent: 4363099 (1982-12-01), Sprinivasan et al.
patent: 4363100 (1982-12-01), Agnew et al.
patent: 4665494 (1987-05-01), Tanaka et al.
Harris F. J.: On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform IEEE, vol. 66, No. 1, Jan. 1978, pp. 51-83.
Phadka et al: A New Measurement Technique for Tracking Voltage Phasors, IEEE Transactions on Power Apparatus and Systems, vol PAS-102 No. 5, May 1983, pp. 1025-1038.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for, and method of, analyzing signals does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for, and method of, analyzing signals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for, and method of, analyzing signals will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1173406

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.