Test and maintenance method and apparatus for investigation of i

Details Test and maintenance method and apparatus for investigation of i Test and maintenance method and apparatus for investigation of i

1986-02-18

1986-11-25

Fleming, Michael R.

Excavating

371 29, G06F 1104

Patent

active

046253122

ABSTRACT:
A test and maintenance system for use with a data processing system comprising a specialized circuit set wherein the circuit set registers can be configured into a serial array, a clock signal distribution system capable of delivering controlled clock signals to selected serial arrays, a maintenance data processor for providing predetermined signal groups, and addressing apparatus responsive to the predetermined signal groups for loading and unloading register arrays in response to the predetermined signals. The disclosed apparatus permits a predetermined signal group to be entered into the serial register array, a predetermined number of clock cycles (i.e. series of operations performed on the data), and the resulting signals shifted from the serial register array and signals applies to data processing unit for display of analysis. By comparing the expected result for a given initial state with the actual result of an operation sequence, the accuracy of the operation of a data processing system, or any portion thereof, can be established. The test and maintenance apparatus can be used to investigate intermittent errors by systematic repetition of a procedure producing the error. For example, fault produced by a failing or marginal component can be distinguished from a fault produced by a mechanical problem. The test and maintenance apparatus can also provide for localization of the intermittent fault through access to all of the register cells.

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