Self-test circuit of information processor

Details Self-test circuit of information processor Self-test circuit of information processor

1989-03-15

1993-04-13

Lee, Thomas C.

Boots, shoes, and leggings

3642628, 3642597, 364267, 3642674, 364DIG1, 395500, G06F 944

Patent

active

052029786

ABSTRACT:
A self-test circuit for an information processor employing a microprogram control system carries out a self-test inside the information processor. The self-test circuit comprises a test data generator for generating test data which are written into specific fields of primary test microinstructions. The self-test circuit further includes a selection controller. The selection controller receives microinstructions, including the primary test microinstructions as well as the test data generated by the test data generator. During the self-test, the selection controller masks specific fields of each primary test microinstruction and supplies the test data from the test data generator in the masked specific fields to form secondary test microinstructions, which are sent to a microinstruction register. With this arrangement, the test data from the test data generator are put in the specific fields of each primary test microinstruction to generate a secondary test microinstruction so that the number and kinds of primary test microinstructions, required for testing functional blocks in the information processor will be reduced.

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Kuban & Bruce, "The MC6804P2 Built-in Self-Test", IEEE Int. Test Conf., 1983, pp. 295-300.

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