Image analysis – Applications – 3-d or stereo imaging analysis
Patent
1997-12-19
2000-08-08
Couso, Jose L.
Image analysis
Applications
3-d or stereo imaging analysis
356376, G06K 900, G01B 1124
Patent
active
061012696
ABSTRACT:
A method and apparatus for rapid three dimensional geometry parametrization of a three dimensional surface. A random speckle pattern is projected upon the surface and imaged to obtain a plurality of two dimensional digital images. The two dimensional images are processed to obtain a three dimensional characterization of the surface. The illuminated surface may be modeled to obtain a parameter set characterizing the surface based upon the two dimensional digital images.
REFERENCES:
patent: 4148587 (1979-04-01), Erdmann et al.
patent: 4657394 (1987-04-01), Halioua
patent: 4746211 (1988-05-01), Ruth et al.
patent: 5548418 (1996-08-01), Gaynor et al.
patent: 5870490 (1999-02-01), Takahashi et al.
Alsberg et al. Three-Dimensional Flow Visualization via Reconstruction from Successive Two-Dimensional Vector Velocity Maps. Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers., Proceedi, Jun. 1994.
Patent Abstracts of Japan, vol. 097, No. 005, May 30, 1997 & JP 09 014914 A (Kishimoto Sangyo KK), Jan. 17, 1997.
Lulli A., et al., "Contrast variations in white-light speckle Interferometry with application to 3D profilometry," Optics Communications, vol. 124, No. 5/06, Mar. 15, 1996, pp. 550-557, XP000583811.
Pryputniewicz, Ryszard J., "Speckle Metrology Techniques and Their Applications," International Conference On Speckle, Henri H. Arsenault, Editor, Proc. SPIE 556, pp. 90-98 (1985).
SPIE Proceedings vol. 2909. Three-Dimensional Imaging And Laser-Based Systems for Metrology and Inspection II Editor(s): Kevin G. Harding, Industrial Technology Institute, Ann Arbor, MI, USA; Donald J. Svetkoff, View Engineering, Inc., Ann Arbor, MI, USA. Abstract only.
Charette Paul G.
Hunter Ian W.
Cage Shawn B.
Couso Jose L.
Lifef/x Networks, Inc.
LandOfFree
Apparatus and method for rapid 3D image parametrization does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for rapid 3D image parametrization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for rapid 3D image parametrization will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1157759