Semiconductor device with function of testing insulation defect

Details Semiconductor device with function of testing insulation defect Semiconductor device with function of testing insulation defect

1993-03-10

1995-03-21

Canney, Vincent P.

Excavating

365201, G01R 3128

Patent

active

054003440

ABSTRACT:
A semiconductor device of this invention includes a memory cell matrix having a plurality of memory cells arranged in a matrix form, a group of bit lines connected to the memory cells and disposed for respective columns of the memory cell matrix, and a testing circuit for effecting the test to check whether the memory cell matrix functions correctly or not. The testing circuit includes a first potential supplying circuit having an output terminal connected to even-numbered bit lines of the bit line group to supply a potential which is as high as 9V to the even-numbered bit lines and a second potential supplying circuit having an output terminal connected to odd-numbered bit lines of the bit line group to supply a potential which is as low as 0V to the odd-numbered bit lines.

REFERENCES:
patent: 5321699 (1994-06-01), Endoh et al.

Affiliated with

Also associated with

Rating

Semiconductor device with function of testing insulation defect does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device with function of testing insulation defect , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device with function of testing insulation defect will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1155285