Apparatus for testing multi-terminal electronic components

Details Apparatus for testing multi-terminal electronic components Apparatus for testing multi-terminal electronic components

1998-09-25

2000-08-08

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 295921, G01R 1073, G01R 3102

Patent

active

061007072

ABSTRACT:
To facilitate the testing of small electronic components, an improved test probe and transport wheel assembly are disclosed. The basic form of the probe features a fixed support body onto which a movable base is secured by at least one resilient structure. Secured to the movable base are a number of leads that may be moved through complementary tunnels in a fixed guide block toward the side-located terminals of an electronic component to be tested. The transport wheel assembly includes a wheel that has a number of peripherally-located compartments for receiving the electronic components. Each of the compartments includes a metal base. Also disclosed is a metal roller that is designed to press on an end of a component during testing. The metal base of each compartment and the metal roller facilitate electrical connection to the component's end-located terminals by side-located leads from the test probe.

REFERENCES:
patent: 3537580 (1970-11-01), Beroset et al.
patent: 4115735 (1978-09-01), Stanford
patent: 4232928 (1980-11-01), Wickersham
patent: 4749945 (1988-06-01), Bonifert et al.
patent: 4818382 (1989-04-01), Anderson et al.
patent: 5568870 (1996-10-01), Utech

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