Device for charging a measuring apparatus for thermal analysis w

Details Device for charging a measuring apparatus for thermal analysis w Device for charging a measuring apparatus for thermal analysis w

1993-06-25

1995-03-21

Noland, Thomas P.

Measuring and testing

Sampler, sample handling, etc.

With heating or cooling

7386481, 374 12, 422 64, G01N 2500

Patent

active

053985567

ABSTRACT:
A device for charging a measuring apparatus for thermal analysis with material specimens filled into containers includes a vertically displaceable gripping member and a rotatable specimen plate with a plurality of openings arranged in a circle. For transferring a specimen container to the measuring location in the measuring apparatus, the specimen container is moved underneath the gripping member by rotating the specimen plate, the gripping member is lowered and the specimen container is gripped by gripping fingers attached to the gripping member. The container is then raised from the specimen plate by raising the gripping member. Subsequently, the specimen plate is rotated until a recess in the specimen plate is located underneath the gripping member. The measuring location is also located directly underneath the gripping member. By lowering the gripping member through the recess in the specimen plate, the specimen container can now be placed on the measuring location and can be released for carrying out the measurement by spreading apart the gripping fingers.

REFERENCES:
patent: 4476733 (1984-10-01), Chlosta et al.
patent: 4670219 (1987-06-01), Nelson et al.
patent: 5064009 (1991-11-01), Melcher et al.
patent: 5235862 (1993-08-01), Harada
SSC5200 Series-Comprehensive Brochure on Thermal Analysis Systems-Seiko Instruments, Inc. pp. 1-15 published by Jun. 1993.

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