Method to reduce test vectors/test time in devices using equival

Details Method to reduce test vectors/test time in devices using equival Method to reduce test vectors/test time in devices using equival

Filed on

1992-10-09

Date issued

1995-05-02

Examiner

Nguyen, Vinh

Patent Class

Electricity: measuring and testing

SubClass

Measuring, testing, or sensing electricity, per se

SubSubClass

With rotor

Other Related Categories

324760, 371 251, 371 224, G01R 3102

Type

Patent

Status

active

Patent number

054123135

Description

ABSTRACT:
A method and apparatus for testing the functionality of a circuit are disclosed which reduce the number of vectors required to simulate and test cells having, for example, similar functions. By using a number of vectors which is independent of the number of cells or blocks in the circuit, the need for multiple test modes is reduced such that the time and cost associated with a functionality test can be reduced.

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