Testable embedded microprocessor and method of testing same

Details Testable embedded microprocessor and method of testing same Testable embedded microprocessor and method of testing same

1994-11-29

1995-11-21

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

371 225, G01R 3128, G01R 31318

Patent

active

054690757

ABSTRACT:
A technique of gaining direct access to the inputs and outputs of an embedded microprocessor, otherwise buried behind additional logic, is disclosed. Multiplexers are provided for at least the embedded microprocessor inputs and outputs. In a test mode, the multiplexers connect device input and output pads directly to the embedded microprocessor inputs and outputs. In a normal operating mode, the multiplexers connect the additional logic to the input and output pads. Preferably, in order to standardize design criteria, multiplexers are provided on all of the inputs and outputs of the microprocessor which may become embedded behind additional logic. Additionally, it is possible in the test mode to control the additional logic to a well defined state. The invention provides a simple way to isolate the embedded microprocessor from the rest of the logic and test it thoroughly using test vectors that have already been developed for the stand-alone microprocessor.

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patent: 3961254 (1976-06-01), Cavaliere et al.
patent: 4357703 (1982-11-01), Van Brunt
patent: 4698588 (1987-10-01), Hwang et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4931722 (1990-06-01), Stoica
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5331643 (1994-07-01), Smith

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