Light-detection system with programmable offset current

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257213, 257225, 250200, 250206, H01L 2700

Patent

active

059368667

DESCRIPTION:

BRIEF SUMMARY
BACKGROUND

The invention relates to a photoelectric semiconductor light-detection device having high dynamic range by virtue of a programmable offset signal.
One known method of reducing the sensitivity of photoelectric semiconductor light-detection devices overall, that is to say for all the pixels at the same time, is the so-called electronic shutter, as described, for example, by H. Akimoto, H. Ono, M. Nakai, A. Sato, T. Sakai, M. Maki, M. Hikiba and H. Ando in "Lateral overflow-gate shutter for CCD image sensors", Proc. SPIE, vol. 1656, pp. 550-557 (1992). In this case, an electronic switch is opened only for a fraction of the integration time, that is to say for the so-called exposure time, to integrate the charge carriers produced by photons. The sensitivity of all pixels can thereby be reduced simultaneously by the integration time/exposure time factor.
A method which makes it possible to use this on/off switching technique individually for the individual pixels of an image sensor has been described by S. Chen and R. Ginosar in "Adaptive sensitivity CCD image sensor", Proc. SPIE, vol. 2415, SUM. 303-309 (1995). In this technique, however, all the pixels are driven at high speed and repeatedly during the image acquisition. This technique cannot therefore be used in practice for relatively large image sensors having hundreds of thousands of pixels.
A known technique of subtracting an offset quantity of charge from an integrated quantity of charge, produced by photons, is the so-called "fill-and-spill" method in CCD technology, as described by W. Yang in "Analog CCD processors for image filtering", Proc. SPIE, vol. 1473, SUM. 114-127 (1991). In this case, a potential well is provided, the depth of which corresponds to the offset quantity of charge. Further to this, a potential well is provided, the depth of which corresponds to the quantity of charge produced by photons, and which is therefore somewhat deeper. When the potential wells are flooded with charge carriers, the somewhat deeper potential well retains a quantity of charge which is proportional to the difference in quantity of charge between the offset quantity of charge and the photocharge. This technique works reliably only in the case of a difference in quantity of charge which is in the percent range of the offset quantity of charge.
Another known technique is based on the use of a current-store element in the feedback circuit of a charge amplifier, that is to say of an operational amplifier having a capacitor in the feedback circuit. This has been described by E. R. Fossum and B. Pain in "Infrared Readout Electronics for Space Science Sensors: State of the Art and Future Directions", Proc. SPIE, vol. 2020, pp. 262-285 (1993). Since a current source is connected in parallel with the integration capacitor, the quantity of charge actually integrated is given by the difference between the quantity of charge produced by photons less an offset quantity of charge which is delivered by this current source. This publication describes that by using this technique for infrared sensor technology, effective compensation of the background infrared sensor technology, effective compensation of the background current and of the fixed pattern noise was achieved, albeit with considerable outlay of circuitry. For voltages across the capacitor which are small in comparison with kT/e, that is to say for a few tens of mV, a transistor can no longer be operated in the saturation range, and nonlinearities are to be expected with this technique.


SUMMARY OF THE INVENTION

The object of the invention is to further develop a photoelectric semiconductor light-detection device in such a way that the offset current can be programmed in photoelectric semiconductor light-detection devices having high dynamic range.
This object is achieved according to the invention by the features specified below.
The invention advantageously makes it possible for the sensitivity of the semiconductor light-detection device to be reduced, and thereby matched to the large dynamic range to

REFERENCES:
patent: 4427990 (1984-01-01), Nishizawa
patent: 4723221 (1988-02-01), Matsuura et al.
patent: 4839735 (1989-06-01), Kyomasu et al.
patent: 4847483 (1989-07-01), Nishibe et al.
patent: 5019876 (1991-05-01), Nishizawa
patent: 5241575 (1993-08-01), Miyatake et al.
patent: 5276407 (1994-01-01), Mead et al.
patent: 5336936 (1994-08-01), Allen et al.
patent: 5376813 (1994-12-01), Delbruck et al.
patent: 5528059 (1996-06-01), Isogai
patent: 5661317 (1997-08-01), Jeong
H. Akimoto et al., "Lateral Overflow-gate Shutter for CCD Image Sensors", SPIE High-Resolution Sensors and Hybrid Systems, vol. 1656, (1992) pp. 550-557.
S. Chen et al., "Adaptive Sensitivity.TM. CCD Image Sensor", SPIE, vol. 2415, pp. 302-309.
W. Yang, "Analog CCD Processors for Image Filtering", SPIE Visual Information Processing: From Neurons to Chips, vol. 1473 (1991), pp. 114-127.
E. Fossum et al., "Infrared Readout Electronics for Space Science Sensors: State of the Art and Future Directions", SPIE Infrared Technology XIX, vol. 2020 (1993), pp. 262-285.
C. Mead, "Transisto Physics", Analog VLSI and Neural Systems, Addison-Wesley Publishing Company, Chapter 3, (1989) pp. 32-41.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Light-detection system with programmable offset current does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Light-detection system with programmable offset current, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Light-detection system with programmable offset current will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1126349

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.