Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1998-08-20
1999-08-10
Manuel, George
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
A61B 314
Patent
active
059367067
ABSTRACT:
Disclosed herein is an ophthalmic instrument equipped with an optical alignment system. The optical alignment system has a Z-alignment index projection light system (60) which projects index light onto the cornea (C) of a subject eye (E) and a sensor (73) which receives reflected light of the index light reflected at the cornea (C). The ophthalmic instrument is further equipped with a Z-alignment detection circuit (74) which computes a positional relation between an index image formed on a light receiving surface of the sensor (73) and the cornea (C). When the result of computation by the detection circuit (74) is within a predetermined range, the subject eye is measured. The Z-alignment index projection light system (60) is provided with an aperture diaphragm (63) which has a transmittance distribution characteristic in which a quantity of light is gradually reduced from the optical axis of the system (60) in a radial direction.
REFERENCES:
patent: 5436679 (1995-07-01), Ohtsuka et al.
patent: 5625428 (1997-04-01), Isogai
patent: 5644375 (1997-07-01), Suzuki
patent: 5696573 (1997-12-01), Miwa
Kabushiki Kaisha Topcon
Manuel George
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