Circuit for testing the operation of a semiconductor device

Details Circuit for testing the operation of a semiconductor device Circuit for testing the operation of a semiconductor device

1996-05-24

1999-02-02

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324766, 438 18, G01R 3126, H03K 513

Patent

active

058670335

ABSTRACT:
A circuit for testing a semiconductor device, which has an oscillator for producing pulses when energized. A control circuit receives a test signal, a clock signal having pulses, and a reset signal, and energizes the oscillator for a predetermined length of time in response to the test signal. A counter detects the pulses produced by the oscillator, and produces counter signals which indicate the number of pulses detected by the counter. An output detector receives the counter signals and produces an output signal when the counter signals indicate that the number of pulses detected is equal to a predetermined number. However, the number of pulses produced by the oscillator during the predetermined length of time is preferably less than the predetermined number. The control circuit provides the clock signal to the counter after the predetermined length of time, until the output of the output detector indicates that the predetermined number of pulses has been detected. The control circuit resets the counter in response to the reset signal.

REFERENCES:
patent: 5068547 (1991-11-01), Gascoyne
patent: 5631596 (1997-05-01), Sporck et al.
patent: 5760599 (1998-06-01), Ehiro

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