Programmable computer system element with built-in self test met

Details Programmable computer system element with built-in self test met Programmable computer system element with built-in self test met

1995-12-14

1997-08-19

Beausoliel, Jr., Robert W.

Excavating

371 225, 39518506, G06F 1100

Patent

active

056595514

ABSTRACT:
Computer system element has a VLSI array with redundant areas and an ABIST (Array Built-In Self Test) system having mirror image fuse registers enabling scan of failed addresses to be used to replace hardware errors detected during power-on at a customer location. The ABIST controller allows self test functions (e.g. test patterns, read/write access, and test sequences) to be modified without hardware changes to the test logic. Test sequence is controlled by logical test vectors, which can be changed, making the task of developing complex testing sequences relatively easy and useful for enabling array self-tests to be performed in a customer's office at power-on reset.

REFERENCES:
patent: 4740970 (1988-04-01), Burrows et al.
patent: 4841485 (1989-06-01), Prilik et al.
patent: 5173906 (1992-12-01), Dreibelbis et al.
patent: 5224101 (1993-06-01), Popyack, Jr.
patent: 5313424 (1994-05-01), Adams et al.
patent: 5386392 (1995-01-01), Cantiant et al.
patent: 5420824 (1995-05-01), Kajimoto et al.
patent: 5442641 (1995-08-01), Beranger et al.
patent: 5511164 (1996-04-01), Brunmeier et al.
patent: 5535164 (1996-07-01), Adams et al.
patent: 5544106 (1996-08-01), Koike
IBM Journal of Research and Development, "Boundary-Scann Design Principles for Efficient LSSD ASIC Testing", by R. W. Bassett et al. vol. 34, No. 2/3, Mar./May, 1990.
USSN 08/450,585 Filed May 31, 1995, by Turgeon et al, entitled "Programmable Built-In Self Test Method and Controller for Arrays". IBM Docket #PO995004.
USSN 08/572,841 Filed Dec. 14, 1995 by Lo et al, entitled "Programmable ABIST Microprocessor for Testing Arrays with Two Logical Views". IBM Docket #PO995059.

Affiliated with

Also associated with

Rating

Programmable computer system element with built-in self test met does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Programmable computer system element with built-in self test met, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Programmable computer system element with built-in self test met will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1110269