In situ dynamic material property measurement system

Details In situ dynamic material property measurement system In situ dynamic material property measurement system

1992-10-19

1994-11-15

Teska, Kevin J.

Boots, shoes, and leggings

364505, 364507, 73573, 73574, 73575, 73 81, 128695, 128739, G06F 1520

Patent

active

053654579

ABSTRACT:
Material is periodically indented by a probe driven at an oscillation frency by a shaker regulated by an analyzer to which input measurement data is fed from a sensing head connecting the shaker to the probe for in situ measurement of material resistance to indentation to which such input data relates. A computer connected to the analyzer is programmed to calculate steady-state data on dynamic material properties as a time dependent function, from outputs of the analyzer restricted to limits determined from the input measurement data.

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