Facsimile and static presentation processing – Static presentation processing – Attribute control
Patent
1985-06-06
1987-04-07
Britton, Howard W.
Facsimile and static presentation processing
Static presentation processing
Attribute control
358107, 358901, H04N 718
Patent
active
046565086
ABSTRACT:
A measuring endoscope for making three-dimensional measurements of a object without using a special lattice and without hampering direct observation of the object. The measuring endoscope includes a light supply source for supplying illumination, and an illumination variation device for providing a plurality of particular illuminations, and illumination transmission means including a plurality of fiber optic cables. The fiber optic cables have a first input section separated from a second input section. The second section receives one particular illumination which the first section does not. At the output end of the fiber optic cables, fiber optic cables from the first section are interlaced, row-by-row with the fiber optic cables from the second section. An illumination lens then directs the light from the fiber optic cables onto the object. A lattice-shaped light pattern then appears on the object. Light reflected from the object is received by an objective lens system and is directed to an imaged sensor. The image sensor includes a large number of regularly arranged picture elements. Image processing devices then convert the received image into electrical signals. The image processing means process selected electrical signals from among all electrical signals received. These selected electrical signals are obtained from picture elements from positions where the lattice of the object image is formed on the light receiving surface. These selected electrical signals may then be processed to provide a three-dimensional measurement of the object. A control device controls the supply of light to the fiber optic cables to ensure that the light is emitted from the fiber optic cables in a lattice form. Finally, a display device connected to the image processor provides a display according to the three-dimensional image of the object.
REFERENCES:
patent: 3327712 (1967-06-01), Kaufman et al.
patent: 4253447 (1981-03-01), Moore et al.
patent: 4331132 (1982-05-01), Mukasa
patent: 4480636 (1984-11-01), Karaki et al.
patent: 4558691 (1985-12-01), Okada
patent: 4562831 (1986-01-01), Murakoshi et al.
Interactive Fringe Analysis System: Applications to Moire Contourogram and Interferogram, by T. Yatagai et al, Optical Engineering, Sep./Oct. 1982, vol. 21, No. 5, pp. 901-906.
Automatic Fringe Analysis Using Digital Image Processing Techniques, by T. Yatagai et al, Optical Engineering, May/Jun. 1982, vol. 21, No. 3, pp. 432-435.
Automatic Flatness Tester for Very Large Scale Integrated Circuit Wafers, by T. Yatagai et al, Optical Engineering, Jul./Aug. 1984, vol. 23, No. 4, pp. 401-405.
Britton Howard W.
Kostak Victor R.
Olympus Optical Co,. Ltd.
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