Method of testing analog/digital converter and structure of anal

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340347CC, 340347M, H03K 1308

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045801266

ABSTRACT:
A method of testing a successive comparison type analog/digital converter which incorporates a voltage comparator, a register for successive comparison and a digital/analog converter. A reference digital signal is inputted to the incorporated digital/analog comparator to be converted into an analog signal, while a digital signal corresponding to the reference digital signal is inputted to an externally provided reference digital/analog converter to be converted into an analog signal. Both analog signals thus produced are compared with each other through the incorporated voltage comparator to thereby determine conversion accuracy. A successive comparison type analog/digital converter suited for the test includes further a change-over switch for introducing the externally supplied digital signal to the incorporated digital/analog converter and a changeover switch for leading outwardly the output signal from the voltage comparator.

REFERENCES:
Naylor, Testing Digital/Analog and Analog/Digital Converters, IEEE Transactions on Circuits and Systems, No. 7, vol. CAS-25, pp. 526-538.
The Engineering Staff of Analog Devices, Inc., Analog-Digital Conversion Handbook, 6/1972, pp. I-1 to I-11; II-46 to II-48; II-80 to II-87; and II-102 to II-111.

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