Method of sorting a group of integrated circuit devices for thos

Details Method of sorting a group of integrated circuit devices for thos Method of sorting a group of integrated circuit devices for thos

1998-09-02

2000-09-19

Gordon, Paul P.

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

700 95, 700108, 700109, 700213, 700215, 250306, 2504921, 250234, G06F 1900

Patent

active

061225630

ABSTRACT:
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data in association with the fuse ID of each of the devices indicating each of the devices requires either enhanced reliability testing or standard testing. The fuse ID of each of the devices is then automatically read before, during, or after standard testing of the devices. The testing process requirement data stored in association with the fuse ID of each of the devices is then accessed, and the devices are sorted in accordance with the accessed data into those devices requiring enhanced reliability testing and those requiring standard testing. The method thus directs those devices needing enhanced reliability testing to such testing without the need for all devices from the same wafer or wafer lot to proceed through special testing.

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Abstract from JP 5-74909, in English, comprising a concise explanation of the relevance of JP-74909 as required by 37 CFR .sctn. 1.98(a)(3).

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