Multi-slit spectrometer

Details Multi-slit spectrometer Multi-slit spectrometer

1998-06-04

2000-09-19

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356308, 356 51, 25033905, G01J 314

Patent

active

061220515

ABSTRACT:
A multi-slit spectrometer is combined with a two-dimensional detector array to enable simultaneous spectral analysis of several objects, improving the signal-to-noise ratio of multispectral imagery. The multi-slit spectrometer includes a multi-slit structure defining a plurality of parallel thin slits, and a first lens for directing object light onto the multi-slit structure. A second lens collimates and directs light which has passed through the slits of the multi-slit structure onto a light dispersing element such as a dispersing prism or a diffraction grating. A third lens focuses light which has passed through the light dispersing element onto the two-dimensional detector array at an image plane. A two dimensional detector array of detector elements is placed at the image plane. The slits are separated by a separation distance equal to an integral multiple of the detector width dimension, where the multiple is equal to (N times the number of slits) plus or minus one, where N is an integer. In an airborne sensor, a mirror which rotates at an angular velocity related to the velocity of the airborne platform directs object light onto the first lens, freezing the image from one or more objects onto the multi-slit structure for an integration time.

REFERENCES:
patent: 3279308 (1966-10-01), Bartz et al.
patent: 3519816 (1970-07-01), Bartz et al.
patent: 5627639 (1997-05-01), Mende et al.
patent: 5768040 (1998-06-01), Macenka et al.

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